structure factor

scan needed?structure factor A quantity denoted F_hkl, where h, k, and l are the Miller indices of the crystal, which occurs in X-ray crystallography and other experiments involving scattering in crystals. F_hkl is defined by the equation: F_hkl = ∑₁f_iexp[2πi(hx_i + ky_i + lz_i)],

where the sum is over all atoms of the unit cell and f_i is the scattering factor for atom i defined by: f_i = 4Π(ρsinkr/kr)r²dr

Here k = 4Πsinθ/λ, where θ is the Bragg angle (see Bragg's law), λ is the wavelength of the X-rays, and ρ is the electron density distribution of the atom i. The structure factor is used in Patterson synthesis.